Keithley Instruments’ newly designed and updated power system source meter is nothing to scoff at. At an exclusive presentation, I was given a first hand opportunity to watch the new power system calculate a testing device within a matter of microseconds. The software output program has the options of viewing the tested device analysis in either table or graph mode. Fascinated with the speed, variance, and detail; I chose to view both outputs. Inasmuch, this meter has triple redundant safety features providing grounding and mechanical fail-safes.
This instrument is capable of testing SiC GaN semiconductors devices which offer: Greater energy efficiency; higher levels of voltage, current, power and frequency; 10x the power density of Si; ½ the size of comparable silicon devices; better high temp performances; and, higher frequencies which results in lower losses during switching.
The newest in this Series 2600A System SourceMeter line, the Model 2657A combines the functionality of multiple instruments in a single full-rack enclosure. Optimized for high voltage applications, such as testing power semiconductor devices, including diodes, FETs, and IGBTs, this system can also characterize high-speed transients and perform breakdown and leakage tests; 3 kV-180 W power; 1 fA resolution; 2 sets of high speed; and a high accuracy (22-bit) A/D converter. If that is not enough, for transient testing this meter’s design gives it the ability to cross between positive and negative quadrants seamlessly without relays, without switching.
Keithley’s Test Script Processor (TSP) provides a virtual backplane, and fully isolated, independent and synchronized channels that enable true SMU-per-pin testing. The software tools for system/production applications are written on Labview and Test Script Builder (A LUA-based software).
Testing on the S530 Parametric Test Systems provides cost effective, high-speed systems for production and R&D, which are ideal for fabrication or applications that support 48-pin full Kelvin (four-wire) switching. It has optional ring oscillator measurements (freq for 10kHz to 20Mhz), optional pulse generation for memory testing, and optional 7-1/2 digit, low noise DMM optimized for low volt for testing.